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ORIGINAL ARTICLE
Year : 2022  |  Volume : 45  |  Issue : 1  |  Page : 28-32

Estimation of Fano factor for oversquare HPGe detector


Indira Gandhi Centre for Atomic Research, Safety, Quality and Resource Management Group, Kalpakkam, Tamil Nadu, India

Correspondence Address:
M Manohari
Room No. 102, HASL Building, HPS/HISD/SQ&RMG, IGCAR, Kalpakkam, Tamil Nadu
India
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Source of Support: None, Conflict of Interest: None


DOI: 10.4103/rpe.rpe_1_22

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Fano factor is a quantity used to measure the departure of the observed variance in the number of charge carriers produced from that predicted using poison statistics. Fano factor varies with the detector type. In case of proportional counters and semiconductor detectors, it is substantially less than unity, whereas, for scintillator detectors, it would be unity. Even in case of semiconductor detectors, it varies with the type and the shape of the detector. Another source of fluctuations that gives the overall resolution of the detector is preamplifier noise. Oversquare coaxial HPGe detectors are a recent development in the field. Literature on the Fano factor of oversquare large volume coaxial detector is not available. In this work, the Fano factor and the electronic noise of an oversquare HPGe coaxial detector are estimated after optimizing the shaping parameters. The Fano factor for the oversquare HPGe detector is estimated as 0.1291 keV, which agrees with the ideal value of 0.13 by 99.98%. The preamplifier noise was found to be 0.048 keV which is 35% lesser than the reported value.


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