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ORIGINAL ARTICLE
Year : 2015  |  Volume : 38  |  Issue : 4  |  Page : 135-138

High sensitivity gamma radiation dosimetry using (In2O3)0.1 (TeO2)0.9thin films


1 Department of Physics, Indian Institute of Technology, Kharagpur, West Bengal, India
2 Radiological Physics and Advisory Division, Bhabha Atomic Research Centre, CTCRS, Anushaktinagar, Mumbai, India

Correspondence Address:
Shivcharan Lal Sharma
Department of Physics, Indian Institute of Technology, Kharagpur - 721 302, West Bengal
India
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Source of Support: None, Conflict of Interest: None


DOI: 10.4103/0972-0464.176156

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The effects of gamma irradiation of various levels on the current-voltage characteristics for the (In2O3)0.1 (TeO2)0.9 thin films, prepared by thermal evaporation in vacuum, have been studied in detail. The current increases linearly with the gamma radiation dose up to certain dose and decreases thereafter. The sensitivity of these thin films, at different applied voltages in the range 0–4.8 V, has been found to be in the range 35–190 mA/cm 2/Gy. Correspondingly, the minimum measurable dose has been found to be in the range 0.05–0.26 mGy. The values of the sensitivity are reasonably high in comparison to the commercially available gamma radiation dosimeters, revealing high scope for further developments.


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